13–15 Oct 2026
Hotel Caesius Terme & SPA Resort - Bardolino - Verona
Europe/Rome timezone

Rapid Interface Strengthening of Cold-Rolled Bimetallic Composite Strips via Electric Pulse Treatment

14 Oct 2026, 17:10
20m
Gardenia room (Hotel Caesius Thermae & Spa Resort)

Gardenia room

Hotel Caesius Thermae & Spa Resort

Via Peschiera, 3, 37011 Bardolino VR

Speaker

Xiaomiao Niu (Taiyuan University of Technology)

Description

The interfacial bonding strength of bimetallic composite strips remains a major limiting factor for their application in high-end engineering fields. Roll bonding is commonly used to fabricate bimetallic composite thin strips, and post processing is required in order to improve the interfacial bonding strength. Conventional annealing processes after roll bonding often lead to excessive recrystallization of the matrix while offering limited improvements in bonding strength.
In this study, copper/stainless steel and copper/titanium composite thin strips were investigated, and a short-duration electric pulse treatment (EPT) was proposed to replace traditional annealing. Results indicate that while cold rolling only achieves preliminary mechanical interlocking, EPT significantly strengthens the interface within seconds through the synergistic coupling of Joule heating and athermal effects. Optimized EPT achieves a significant increase in peel strength, surpassing conventional annealing at equivalent temperatures while maintaining high tensile strength. Microstructural analysis reveals that EPT accelerates interfacial atomic diffusion and promotes grain refinement, forming a dense and continuous metallurgical bonding layer. Consequently, a synergistic enhancement of the bonding and tensile strength of the composite strips is achieved. The "Cold Rolling-EPT" process developed in this study provides a novel and efficient strategy for the fabrication of high-performance composite thin strips.

Speaker Company/University Taiyuan University of Technology

Author

Xiaomiao Niu (Taiyuan University of Technology)

Co-authors

Mr Weiquan You (Taiyuan University of Technology) Prof. Tao Wang (Taiyuan University of Technology)

Presentation materials

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